Charging and discharging of defect states in CIGS/ZnO junctions

Citation
Ae. Delahoy et al., Charging and discharging of defect states in CIGS/ZnO junctions, THIN SOL FI, 361, 2000, pp. 140-144
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
361
Year of publication
2000
Pages
140 - 144
Database
ISI
SICI code
0040-6090(20000221)361:<140:CADODS>2.0.ZU;2-5
Abstract
The formation of photovoltaic junctions in thin film CIGS has been explored through the deposition of ZnO directly onto the CIGS by the reaction of Zn and atomic oxygen. Most of these devices exhibit strong light soaking effe cts in which V-oc (at 1 sun) can increase from 250 mV to over 550 mV. A 12. 3% efficient ZnO/CIGS solar cell was achieved. The soaking effect, which is the main topic of this paper, was found to be bias or field driven. Detail ed investigations were conducted using a 'drive and interrogate' procedure, in which the device is driven between two steady states corresponding to t wo different voltage biases, with brief interrogation of V-oc at various ti mes. Data spanning the temperature range 31-125 degrees C were acquired. It was found that the V-oc versus log(t) relaxation curves can be described b y a stretched exponential. and scale with t.exp(-E/kT) as a parameter, yiel ding E = 0.51 eV. Junction capacitance data are also reported. The underlyi ng process, whether electronic or ionic, possesses a wide range of time con stants. (C) 2000 Elsevier Science S.A. All rights reserved.