Numerical simulations of the defect distribution of CuInSe2 were carried ou
t as a function of the stoichiometry. The simulations are based on a new ca
lculation of the intrinsic defects in this material. The results of the cal
culations were compared with earlier electrical and positron lifetime measu
rements. This leads to the assumption, that the single defects V-Se, V-Cu,
Cu-1n and the defect pair (2V(Cu)-In-Cu) occur in the investigated specimen
s in considerable concentrations. (C) 2000 Elsevier Science S.A. All rights
reserved.