Calculation and experimental characterization of the defect physics in CuInSe2

Citation
J. Klais et al., Calculation and experimental characterization of the defect physics in CuInSe2, THIN SOL FI, 361, 2000, pp. 446-449
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
361
Year of publication
2000
Pages
446 - 449
Database
ISI
SICI code
0040-6090(20000221)361:<446:CAECOT>2.0.ZU;2-H
Abstract
Numerical simulations of the defect distribution of CuInSe2 were carried ou t as a function of the stoichiometry. The simulations are based on a new ca lculation of the intrinsic defects in this material. The results of the cal culations were compared with earlier electrical and positron lifetime measu rements. This leads to the assumption, that the single defects V-Se, V-Cu, Cu-1n and the defect pair (2V(Cu)-In-Cu) occur in the investigated specimen s in considerable concentrations. (C) 2000 Elsevier Science S.A. All rights reserved.