Chemical bath deposited Zn(Se,OH)(x) on Cu(In,Ga)(S,Se)(2) for high efficiency thin film solar cells: growth kinetics, electronic properties, device performance and loss analysis

Citation
A. Ennaoui et al., Chemical bath deposited Zn(Se,OH)(x) on Cu(In,Ga)(S,Se)(2) for high efficiency thin film solar cells: growth kinetics, electronic properties, device performance and loss analysis, THIN SOL FI, 361, 2000, pp. 450-453
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
361
Year of publication
2000
Pages
450 - 453
Database
ISI
SICI code
0040-6090(20000221)361:<450:CBDZOC>2.0.ZU;2-0
Abstract
Zn(Se,OH), thin films were grown on Cu(In,Ga)(S,Se)(2) (CIGSS) substrate by chemical bath technique. The initial formation and subsequent development of the CIGSS/Zn(Se,OH), interface are studied by XPS photoemission spectros copy. Changes in the In Id and Zn 3d core lines are used to directly determ ine the CIGSS/Zn(Se,OH)(x) heterojunction valence band discontinuity and th e consequent heterojunction band diagram. For device optimization the thick ness and good surface coverage Here controlled by XPS-UPS photoemission spe ctroscopy. A Zn(Se,OH)(x) thickness below 10 nm has been found to be optimu m for achieving a homogeneous and compact film on CIGSS. A remarkably high active area efficiency up to 15.7% (total area efficiency 13.26% with open circuit voltage (V-oc) up to 565.71 mV, a fill factor (FF) of 71% and a sho rt-circuit photocurrent density (J(ph)) greater than 33.01 mA/cm(2)) are ob tained. The internal parameters, such as the saturation currents, the serie s resistance R, and shunt resistance R-sh are calculated. Major losses in t hese cells are due to the significant influence of the series resistance R, on the fill factor. (C) 2000 Elsevier Science S.A. All rights reserved.