Investigations into local ferroelectric properties by atomic force microscopy

In this article, we describe nanometer scale characterization of piezoelect ric thin films of Lead-Zirconate-Titanate (PZT). Using the electric field f rom a biased conducting atomic-force microscopy (AFM) tip, we show that it is possible to form and subsequently image ferroelectric domains. Using a s phere-plane model for the tip-sample system we calculate the distribution o f electric potential, field and polarization charge, and find good agreemen t with the experimental values. We also discuss the effects of surface cont aminants on domain formation. (C) 2000 Elsevier Science B.V. All rights res erved.