AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscale

Citation
Al. Tolstikhina et al., AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscale, ULTRAMICROS, 82(1-4), 2000, pp. 149-152
Citations number
4
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ULTRAMICROSCOPY
ISSN journal
03043991 → ACNP
Volume
82
Issue
1-4
Year of publication
2000
Pages
149 - 152
Database
ISI
SICI code
0304-3991(200002)82:1-4<149:ACODSO>2.0.ZU;2-R
Abstract
Atomic force microscopy has been used for the study of the surface topograp hy and domain structures of triglycin sulfate (TGS) crystals. The images of various types of domains at the polar (0 1 0) surfaces of as-cleaved TGS c rystals have been obtained (in contact mode and resonant mode). The crystal s grown old, after annealing, gamma-irradiated by various doses, were studi ed. It has been found that the surface relief of crystals after annealing d iffers from that of crystals grown old and irradiated: in the first case th e peak-to-peak value is nearly constant whereas in the second case it varie s in wide limits. The parameters of domain structure were determined. These parameters have been shown to be different for crystals grown old, crystal s after annealing and irradiated crystals. It has been shown that, after ca ntilever scanning after a long period in different AFM modes the TGS surfac e experiences a partial polarization reversal. (C) 2000 Elsevier Science B. V. All rights reserved.