K. Harriman et al., Adaptive finite element simulation of currents at microelectrodes to a guaranteed accuracy. Theory, ELECTROCH C, 2(3), 2000, pp. 157-162
In our accompanying payer (K. Harriman et al., Electrochem. Commun. 2 (2000
) 150) we demonstrated how, for the finite element method, an automatic mes
h-adaptation algorithm can be derived, given an a posteriori error bound on
the simulated current. In this paper we give the technical details of the
background theory of the finite element method, and the derivation of the a
posteriori error bound. (C) 2000 Elsevier Science S.A. All rights reserved
.