High energy resolution position sensitive spectrometer with a flat-crystal

Wavelength dispersive position sensitive spectrometer(PSS) with a flatcryst al is a-new type of high energy resolution equipment for analyzing X rays. It can be used in study of elemental analysis, chemical states and atomic p hysics. The paper describes the performance of PSS developed by us as well as the principle of PSS and its core part-position sensitive proportional c ounter. The energy resolution of 25eV, 15eV and 7eV have been obtained for Fe-55, Ti and Si, respectively, using developed PSS. Such resolution can me et the requirement in elements analyses.