Analysis of tape surface roughness by magnetic recording and mechanical methods

Authors
Luo, P Tan, SW Bertram, HN Hughes, G Talke, FE
Citation
P. Luo et al., Analysis of tape surface roughness by magnetic recording and mechanical methods, IEEE MAGNET, 36(1), 2000, pp. 189-194
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
00189464 → ACNP
Volume
36
Issue
1
Year of publication
2000
Part
1
Pages
189 - 194
Database
ISI
SICI code
0018-9464(200001)36:1<189:AOTSRB>2.0.ZU;2-A
Abstract
Tape surface roughness noise is a large component of medium noise in high-d ensity tape recording systems. Here, the results of tape surface roughness characterization by both mechanical and magnetic measurements are presented . The goal is to measure and compare both RMS roughness variance sigma and roughness correlation length l. The results show that the magnetic recordin g determination of sigma and l agrees extremely well with the mechanical me asurements.