Software reliability models with time-dependent hazard function based on Bayesian approach

Authors
Citation
L. Pham et H. Pham, Software reliability models with time-dependent hazard function based on Bayesian approach, IEEE SYST A, 30(1), 2000, pp. 25-35
Citations number
15
Categorie Soggetti
AI Robotics and Automatic Control
Journal title
IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART A-SYSTEMS AND HUMANS
ISSN journal
10834427 → ACNP
Volume
30
Issue
1
Year of publication
2000
Pages
25 - 35
Database
ISI
SICI code
1083-4427(200001)30:1<25:SRMWTH>2.0.ZU;2-X
Abstract
In this paper, two models predicting mean time until next failure based on Bayesian approach are presented. Times between failures follow Weibull dist ributions with stochastically decreasing ordering on the hazard functions o f successive failure time intervals, reflecting the tester's intent to impr ove the software quality with each corrective action. We apply the proposed models to actual software failure data and show they give better results u nder sum of square errors criteria as compared to previous Bayesian models and other existing times between failures models, Finally, we utilize likel ihood ratios criterion to compare new models predictive performance.