A CAD-compatible SOI-CMOS gate array using 0.35 mu m partially-depleted transistors

Citation
K. Ueda et al., A CAD-compatible SOI-CMOS gate array using 0.35 mu m partially-depleted transistors, IEICE TR EL, E83C(2), 2000, pp. 205-211
Citations number
9
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEICE TRANSACTIONS ON ELECTRONICS
ISSN journal
09168524 → ACNP
Volume
E83C
Issue
2
Year of publication
2000
Pages
205 - 211
Database
ISI
SICI code
0916-8524(200002)E83C:2<205:ACSGAU>2.0.ZU;2-3
Abstract
This paper describes a 0.35 mu m SOI-CMOS gate array using partially-deplet ed transistors. The gate array adopts the field-shield isolation technique with body-tied structures to suppress floating-body problems such as: (1) k ink characteristics in drain currents, (2) low break-down voltage, and (3) frequency-dependent delay time. By optimizing the basic-cell layout and pow er-line wiring, the SOI-CMOS gate array also allows the use of the cell lib raries and the design methodologies compatible with bulk-CMOS gate arrays. An ATM (Asynchronous Transfer Mode) physical-layer processing LSI was fabri cated using a 0.35 mu m SOI-CMOS gate array with 560k raw gates. The LSI op erated at 156 Mbps at 2.0 V, while consuming 71% less power than using a ty pical 0.35 mu m 3.3 V bulk-CMOS gate array.