This paper describes a 0.35 mu m SOI-CMOS gate array using partially-deplet
ed transistors. The gate array adopts the field-shield isolation technique
with body-tied structures to suppress floating-body problems such as: (1) k
ink characteristics in drain currents, (2) low break-down voltage, and (3)
frequency-dependent delay time. By optimizing the basic-cell layout and pow
er-line wiring, the SOI-CMOS gate array also allows the use of the cell lib
raries and the design methodologies compatible with bulk-CMOS gate arrays.
An ATM (Asynchronous Transfer Mode) physical-layer processing LSI was fabri
cated using a 0.35 mu m SOI-CMOS gate array with 560k raw gates. The LSI op
erated at 156 Mbps at 2.0 V, while consuming 71% less power than using a ty
pical 0.35 mu m 3.3 V bulk-CMOS gate array.