Advanced LSI embedded with FeRAM for contactless IC cards and its manufacturing technology

Citation
Y. Shimada et al., Advanced LSI embedded with FeRAM for contactless IC cards and its manufacturing technology, INTEGR FERR, 27(1-4), 1999, pp. 1335-1358
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
INTEGRATED FERROELECTRICS
ISSN journal
10584587 → ACNP
Volume
27
Issue
1-4
Year of publication
1999
Pages
1335 - 1358
Database
ISI
SICI code
1058-4587(1999)27:1-4<1335:ALEWFF>2.0.ZU;2-B
Abstract
High performance LSIs embedded with ferroelectric random access memory (FeR AM) for contactless IC cards are now commercially available. The emphasis i s placed on the materials solution with SrBi2(Ta,Nb)(2)O-9 (SBTN) which ena bles to exploit the potential performance of FeRAMs for composite logic/mic rocontroller LSIs operating at high speeds and low powers. The leading-edge 0.6-mu m and double-level-metal FeRAM technology produces microcontroller- embedded LSIs with 14-kbit or 64-kbit FeRAM. A mature 0.8-mu m and single-l evel-metal process has been built to maximize the die yield. Yields exceedi ng 90% indicate the excellent process stability. Product qualification data have proven the robust FeRAM technologies.