M. Hoffman et al., Reversible and irreversible domainwall contributions to the polarization in CSD prepared Ba1-xPbx(Ti,Mn)O-3 thin films, INTEGR FERR, 26(1-4), 1999, pp. 1033-1044
Ba1-xPbxTiO3 (BPT) as a thin film system has been developed to investigate
the ferroelectric properties respectively the different ferroelectric polar
ization contributions. BPT has been synthesized using CSD based on metal pr
opionates. The films were deposited on platinum coated silicon wafers and a
nnealed at 750 degrees C. The BPT thin films were characterized with X-ray
diffraction and SEM.
Hysteresis, C-V measurements and leakage current measurements were used to
investigate the electrical properties of the films. Special attention has b
een given to the frequency dependence of the hysteresis loop- and C-V-measu
rements to distinguish the reversible and irreversible parts of the total f
erroelectric polarization. Static hysteresis curve measurements [1] were us
ed to characterize the particular polarization contributions of the ferroel
ectric thin films independent of the measuring frequency.