Full chemical fabrication of SrBi2(Ta,Nb)(2)O-9 ferroelectric thin film capacitors

Citation
Jh. Yi et al., Full chemical fabrication of SrBi2(Ta,Nb)(2)O-9 ferroelectric thin film capacitors, INTEGR FERR, 23(1-4), 1999, pp. 77-88
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
INTEGRATED FERROELECTRICS
ISSN journal
10584587 → ACNP
Volume
23
Issue
1-4
Year of publication
1999
Pages
77 - 88
Database
ISI
SICI code
1058-4587(1999)23:1-4<77:FCFOSF>2.0.ZU;2-A
Abstract
SrBi2(Ta,Nb)(2)O-9 ferroelectric thin film capacitors with RuO2 electrodes were prepared for the first time by a full chemical route. Stable sols of S rBi2(Ta,Nb)(2)O-9 precursors were obtained from mixtures of niobium (tantal um) ethoxide, bismuth and strontium 2-ethylhexanoates, Ruthenium dioxide pr ecursors was prepared by dissolving an aqueous solution of ruthenium nitros ylnitrate into 2-methoxyethanol. Capacitors were fabricated by sequential s pin coating the precursors on silicon wafers according to the sequence Si/R uO2/SrBi2(Ta,Nb)(2)O-9/RuO2. Fully crystallized crack-free materials were o btained by annealing at 700 degrees C for 2 h. Hysteresis loops (3 - 10 V) are similar to those observed using platinum electrodes.