Time domain spectroscopy has been used to measure the room temperature tran
smission of highly doped GaAs in the frequency range from 0.2 to above 3 TH
z. We studied n- and p-type layers, with carrier densities between 10(16) a
nd 2 x 10(18) cm(-3), which had been grown on undoped GaAs substrates. Tran
smission spectra could be fitted within experimental error by using a Drude
model for the conductivity. Fitted carrier densities for both carrier type
s and mobilities for p-type GaAs were in good agreement with the results of
Hall measurements. In the case of n-GaAs, the optically determined mobilit
y appeared to underestimate slightly the Hall mobility. (C) 2000 American I
nstitute of Physics. [S0021-8979(00)04404-2].