Js. Morrell et al., Epitaxial growth of gadolinium oxide on roll-textured nickel using a solution growth technique, J MATER RES, 15(3), 2000, pp. 621-628
Chemical solution epitaxy was used to deposit an epitaxial film of Gd2O3 on
roll-textured nickel. A 2-methoxyethanol solution of gadolinium methoxyeth
oxide was used for spin-coating and dip-coating. Films were crystallized us
ing a heat treatment at 1160 degrees C for 1 h in 4% H-2/96% Ar. Single-lay
er films were approximately 600 Angstrom in thickness, and thicker films co
uld be produced using multiple coatings. theta/2 theta x-ray diffractograms
revealed only (0041) reflections, indicating a high degree of out-of-plane
texture. A pole-figure about the Gd2O3 (222) reflection indicated a single
in-plane epitaxy. Scanning electron microscopy showed that the films were
smooth, continuous, and free of pin holes. Atomic force microscopy revealed
an average surface roughness of 53 Angstrom. Electron diffraction indicate
d that the misalignment of the majority of the grains in the plane was less
than 10 degrees. High-current (0.4 MA/cm(2)) YBa2Cu3O7-delta films were gr
own on roll-textured nickel substrates using Gd2O3 as the base layer in a t
hree-layer buffer structure.