Strain relaxation in surface nano-structures studied by X-ray diffraction methods

Citation
T. Baumbach et al., Strain relaxation in surface nano-structures studied by X-ray diffraction methods, MAT SCI E B, 69, 2000, pp. 392-396
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107 → ACNP
Volume
69
Year of publication
2000
Pages
392 - 396
Database
ISI
SICI code
0921-5107(20000119)69:<392:SRISNS>2.0.ZU;2-P
Abstract
We study the lattice strain relaxation in pseudomorphic surface gratings us ing high resolution X-ray diffraction and elasticity theory. Symmetrical an d asymmetrical X-ray diffraction gives evidence of a non-uniform strain rel axation in the etched structures and the creation of a periodic strain fiel d deep in the substrate. The experimental findings are confirmed by an elas ticity model which describes the interaction of the different crystalline m edia. By comparing the measured with calculated diffraction maps, we determ ine the actual strain distribution in the trapezoidal grating and in the su bstrate. (C) 2000 Elsevier Science S.A. All rights reserved.