Symmetry and passivation dependence of the optical properties of nanocrystalline silicon structures

Citation
E. Degoli et al., Symmetry and passivation dependence of the optical properties of nanocrystalline silicon structures, MAT SCI E B, 69, 2000, pp. 444-448
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107 → ACNP
Volume
69
Year of publication
2000
Pages
444 - 448
Database
ISI
SICI code
0921-5107(20000119)69:<444:SAPDOT>2.0.ZU;2-B
Abstract
The electronic and optical properties of Si-based quantum wells (QW's) are studied ab initio by means of the linear-muffin-tin-orbital (LMTO) method i n order to investigate their dependence on the symmetry of the lattice and on the passivating species that saturates the Si dangling bonds. We find th at the symmetry of the lattice changes the nature of the gap that is indire ct in the Si-H(111) saturated QW's and becomes direct in the Si-H(001) satu rated QW's. The saturating species play instead an important role in the fo rmation of interface states that can occupy or leave free the band gap so i mproving or making worse the optical properties of the material. Studying t he Si-SiO2(001) superlattice we found that oxygen related defects play an i mportant role in the determination of the optoelectronic properties of the material. (C) 2000 Elsevier Science S.A. All rights reserved.