Ge tetramer structure of the p(2 root 2x4 root 2)R45 degrees surface reconstruction of Ge/Ag(001): A surface x-ray diffraction and STM study

Authors
Oughaddou, H Gay, JM Aufray, B Lapena, L Le Lay, G Bunk, O Falkenberg, G Zeysing, JH Johnson, RL
Citation
H. Oughaddou et al., Ge tetramer structure of the p(2 root 2x4 root 2)R45 degrees surface reconstruction of Ge/Ag(001): A surface x-ray diffraction and STM study, PHYS REV B, 61(8), 2000, pp. 5692-5697
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
10980121 → ACNP
Volume
61
Issue
8
Year of publication
2000
Pages
5692 - 5697
Database
ISI
SICI code
1098-0121(20000215)61:8<5692:GTSOTP>2.0.ZU;2-I
Abstract
The surface atomic structure of the p(2 root 2X4 root 2)R45 degrees superst ructure obtained at 0.5-monolayer coverage by deposition of germanium on th e Ag(001) surface at room temperature has been investigated using surface x -ray diffraction and scanning tunneling microscopy. A structural model is p roposed with clusters of four Ge atoms preferentially adsorbed near hollow and bridge sites on the surface. The Ge-Ag bond strength is sufficient to i nduce rearrangement of the Ag atoms in the uppermost layers and stabilize t he reconstruction.