Quantitative measurements of the chemical composition of unprepared samples, using a reflectron mass analyzer with a microchannelplate detector assembly

This article presents measurements of the chemical composition of Al-Li sam ples using a reflectron mass analyzer and laser ionization of the sample. T he measurements were taken of as-received samples with rough surfaces to as certain if useful results could be obtained from samples that had not been cleaned or prepared in any way. The power density of the laser used (Nd:ytt rium-aluminum-garnet lambda = 1.06 mu m, E congruent to 6 mJ, tau = 5 ns) w as I similar to 3 x 10(9) W/cm(2). We have described the quantitative proce ssing of our results using the measured analog particle gains of the Galile o microchannelplates. The problems associated with quantitative measurement s of ion pulses using a microchannelplate detector assembly are also discus sed. (C) 2000 American Institute of Physics. [S0034-6748(00)54902-8].