An apparatus for supersonic jet epitaxy of thin films

Citation
Sa. Ustin et al., An apparatus for supersonic jet epitaxy of thin films, REV SCI INS, 71(3), 2000, pp. 1479-1487
Citations number
33
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
3
Year of publication
2000
Pages
1479 - 1487
Database
ISI
SICI code
0034-6748(200003)71:3<1479:AAFSJE>2.0.ZU;2-Q
Abstract
An ultrahigh vacuum chemical beam epitaxy growth system has been built usin g multiple supersonic jets as precursors. Supersonic jets provide very high flux to the growth front while maintaining low growth pressures (10(-5) To rr). Activation barriers to chemisorption are overcome by using hypertherma l (1-10 eV) precursors for heteroepitaxial growth. Improvement in growth ra tes and higher degrees of structural orientation are obtained at lower temp eratures. Wide band gap semiconductors (SiC, GaN, and AlN) are deposited on silicon substrates using neutral chemical precursors. Epitaxial growth of SiC on silicon has been obtained at the lowest temperatures reported to dat e using a supersonic jet of methylsilane. (C) 2000 American Institute of Ph ysics. [S0034-6748(00)03903-4].