Examination of EL and PL properties of MCHM-PPV and MEH-PPV: a study towards introduction of a new series of thin film EL devices

Citation
Dj. Choo et al., Examination of EL and PL properties of MCHM-PPV and MEH-PPV: a study towards introduction of a new series of thin film EL devices, THIN SOL FI, 363(1-2), 2000, pp. 37-41
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
363
Issue
1-2
Year of publication
2000
Pages
37 - 41
Database
ISI
SICI code
0040-6090(20000301)363:1-2<37:EOEAPP>2.0.ZU;2-G
Abstract
The effect of the side group, employed during synthesis, on the PL (photolu minescence), EL (electroluminescence) profiles and the light intensity of P PV derivatives has been investigated using MEH (methoxy-ethyl hexyloxy) and MCHM (methoxy-cyclo-hexyl-methyloxy) as side groups. The measurements show that even the most subtle change in molecular structure of PPV has a marke d improvement on the EL, PL profiles and the light emission intensity. It h as been found that the PL and EL intensities of the MCHM-PPV are higher tha n those of MEH-PPV. MCHM-PPV also demonstrated higher light emission at low er potentials and currents. (C) 2000 Elsevier Science S.A. All rights reser ved.