X-ray excited optical luminescence (XEOL): a potential tool for OELD studies

An X-ray excited optical luminescence (XEOL) technique using laboratory sof t X-rays and synchrotron radiation in the visible-UV and soft X-ray region will be discussed. It is shown that XEOL takes advantage of the penetration power of the X-rays and the tunability of the photons from a synchrotron s ource. Thus XEOL provides some sampling depth and site selectivity and allo ws for the probing of underlayers and buried interfaces. XEOL studies of po rous silicon and a poly-vinyl-carbazole film will be used to illustrate tha t this technique is suited for the study of organic luminescent materials a nd organic electroluminescence devices (OELD). (C) 2000 Elsevier Science S. A. All rights reserved.