Citation
Zp. Guo et al., High-resolution CT tests ceramic parts, AM CERAM S, 79(1), 2000, pp. 59-61
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
AMERICAN CERAMIC SOCIETY BULLETIN
ISSN journal
00027812
→ ACNP
Volume
79
Issue
1
Year of publication
2000
Pages
59 - 61
Database
ISI
SICI code
0002-7812(200001)79:1<59:HCTCP>2.0.ZU;2-E
Abstract
A high resolution X-ray computed tomography system uses a scintillation scr
ee, fiber-optically coupled to a thermoelectrically cooled line array CCD f
or testing ceramic parts.