M. Fleischer et al., Fast algorithms for data reduction in modern optical three-dimensional profile measurement systems with MMX technology, APPL OPTICS, 39(8), 2000, pp. 1290-1297
Confocal microscopy and white-light interferometry are two promising method
s for the three-dimensional microstructure analysis of technical and biolog
ic specimens. For both methods the specimen is scanned through the focus po
sition by means of an actuator. A large series of intensity frames is acqui
red. These data are used for the final calculation of the topography, We de
monstrate that the multimedia extended (MMX) instruction set, which is impl
emented in modern Intel microprocessors, can be used for effective real-tim
e preprocessing and for fast evaluation algorithms. So this new technique e
nables the implementation of more-complex algorithms with acceptable run ti
mes even on standard computer technology. The possibilities of the MMX inst
ruction set are discussed for confocal microscopy and for technology. The p
ossibilities of the MMX instruction set are white-light interferometry. (C)
2000 Optical Society of America.