Fast algorithms for data reduction in modern optical three-dimensional profile measurement systems with MMX technology

Confocal microscopy and white-light interferometry are two promising method s for the three-dimensional microstructure analysis of technical and biolog ic specimens. For both methods the specimen is scanned through the focus po sition by means of an actuator. A large series of intensity frames is acqui red. These data are used for the final calculation of the topography, We de monstrate that the multimedia extended (MMX) instruction set, which is impl emented in modern Intel microprocessors, can be used for effective real-tim e preprocessing and for fast evaluation algorithms. So this new technique e nables the implementation of more-complex algorithms with acceptable run ti mes even on standard computer technology. The possibilities of the MMX inst ruction set are discussed for confocal microscopy and for technology. The p ossibilities of the MMX instruction set are white-light interferometry. (C) 2000 Optical Society of America.