Temperature-dependent Hall measurements of thin GaN films subjected to He i
on irradiation at ever increasing doses are used to study the electron tran
sport in GaN. It is shown that electron transport is a thermally activated
process with activation energies gradually increasing with reciprocal net c
arrier concentration, until a saturated value of the activation energy is r
eached. These experiments provide a direct verification that conductivity i
n thin GaN layers is controlled by potential barriers caused by depletion o
f carriers at grain boundaries in the material. Values of average grain siz
e, density of surface states at the grain boundaries, and their energetics
are extracted from the experiment. (C) 2000 American Institute of Physics.
[S0003-6951(00)01411-X].