Ultra-thin film deposition and characterisation of 10nm amorphous carbon layers for applications in magnetic storage devices

This paper will present an overview of our latest results using various ult ra-thin film amorphous carbon deposition techniques, and focus on first to grow studies, nano-characterisation of the electrical, mechanical and barri er properties associated with films grown on various substrate types applie d to the magnetic recording industry. Although some of the characterisation is carried out on 10nm coatings, the nanomechanical measurements are perfo rmed on samples with thickness values between 30nm to 200nm. This overview of our work deals with PECVD deposition techniques and examines ultra-thin film growth on Si and Al2O3: TiC substrates. Some results are presented on the functional benefits of doping a-C:H films with Silicon and Nitrogen. Al l the work is related to the ability to produce effective 3nm to 10nm overc oat layers for new magnetic recording applications.