Amorphous carbon coatings (a-C, a-C:H) of less than 100 nm thick were depos
ited on KBr pellets and silicon wafer substrate via magnetron sputtering of
graphite target in argon, argon/hydrogen and argon/nitrogen atmosphere. Pa
rallel electron energy loss spectroscopy (PEELS) analysis was used to quant
ify the sp(2) / sp(3) bonding in carbon films. Stand-alone films of amorpho
us carbon were produced by sputtering onto compressed KBr pellets and then
floating off in distilled water for PEELS study. Raman spectroscopy was use
d to measure the peak intensity ratio of D-band to that of the G-band (I-d/
I-g). It shows that higher sp(3) fraction often associates with lower Raman
peak ratio I-d/I-g. At the same time, G-band peak position P-g deceases wh
ile sp(3) fraction increases.