Investigation of structure and growth of self-assembled polyelectrolyte layers by X-ray and neutron scattering under grazing angles

The structure of self-assembled polyelectrolyte thin films on float glass h as been investigated by interface sensitive X-ray and neutron scattering me thods. Special emphazis was given to the adsorption process of poly (ethyle ne imine) and polystyrole sulfonate as an important model system which is o ften used as a basis for subsequent multilayer buildup. From complementary X-ray and neutron reflectivity data, the vertical film density profile was derived for various growth parameters, including kinetic effects of differe nt adsorption times. In addition to specular reflectivity, we have for the first time employed nonspecular X-ray scattering to study lateral structure parameters in self-assembled polyelectrolyte films. Furthermore, the techn ique of time-resolved in situ X-ray reflectivity during film growth has bee n demonstrated and is discussed in view of its future potential. (C) 2000 A cademic Press.