Small-angle X-ray scattering studies on nucleation formation of dextran precipitation in the presence of boron

Citation
Y. Hirata et al., Small-angle X-ray scattering studies on nucleation formation of dextran precipitation in the presence of boron, J COLL I SC, 223(1), 2000, pp. 139-141
Citations number
7
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF COLLOID AND INTERFACE SCIENCE
ISSN journal
00219797 → ACNP
Volume
223
Issue
1
Year of publication
2000
Pages
139 - 141
Database
ISI
SICI code
0021-9797(20000301)223:1<139:SXSSON>2.0.ZU;2-Y
Abstract
In the present study, the nucleation formation process of dextran precipita tion in the presence of boron was investigated by small-angle X-ray scatter ing (SAXS) techniques. The formation mechanism of aggregates or nuclei is v ery important in the initial step of crystallization. SAXS measurement is a n excellent technique for observing these processes. The results of SAXS me asurement suggest that boron, as a trace impurity, induces the aggregating of dextran molecules intermolecularly as a process in the nucleation format ion of dextran precipitate nuclei and causes precipitation of dextran throu gh an elongation process. These reactions occur readily at low boron Concen trations. In fact, boron, which was detected at low levels in dextran solut ions, was concentrated in the precipitates. Therefore, an aqueous solution of boron-free dextran should be resistant to precipitation. (C) 2000 Academ ic Press.