Y. Hirata et al., Small-angle X-ray scattering studies on nucleation formation of dextran precipitation in the presence of boron, J COLL I SC, 223(1), 2000, pp. 139-141
In the present study, the nucleation formation process of dextran precipita
tion in the presence of boron was investigated by small-angle X-ray scatter
ing (SAXS) techniques. The formation mechanism of aggregates or nuclei is v
ery important in the initial step of crystallization. SAXS measurement is a
n excellent technique for observing these processes. The results of SAXS me
asurement suggest that boron, as a trace impurity, induces the aggregating
of dextran molecules intermolecularly as a process in the nucleation format
ion of dextran precipitate nuclei and causes precipitation of dextran throu
gh an elongation process. These reactions occur readily at low boron Concen
trations. In fact, boron, which was detected at low levels in dextran solut
ions, was concentrated in the precipitates. Therefore, an aqueous solution
of boron-free dextran should be resistant to precipitation. (C) 2000 Academ
ic Press.