Jl. Maurice et al., Transmission electron microscopy of La0.67Sr0.33MnO3/SrTiO3/La0.67Sr0.33MnO3 heterostructures grown by pulsed laser deposition on (001) SrTiO3, J MAGN MAGN, 211(1-3), 2000, pp. 91-96
We have analysed by cross-section transmission electron microscopy (XTEM) L
a0.67Sr0.33MnO3/SrTO3/La0.67Sr0.33MnO3 tunnel junctions epitaxially grown o
n (0 0 1) SrTiO3 by pulsed laser deposition (PLD). La0.67Sr0.33MnO3 (LSMO)
is rhombohedral in bulk (pseudo-cubic with an angle of 89.76 degrees); its
epitaxy on SrTiO3 raises two binds of questions: (1) are the interfaces che
mically abrupt? And (2) is the LSMO strained to a tetragonal phase that wou
ld fit the cubic substrate? In the present paper, we show, using high-resol
ution TEM (HRTEM) micrographs and a semi-quantitative technique based on Ch
emical Mapping (A. Ourmazd et al., Ultramicroscopy 34 (1990) 237) that the
extent of roughness or interdiffusion at the interfaces is less than a sing
le unit cell. On the other hand, we deduce from electron diffraction that t
he LSMO films are at least partially relaxed. (C) 2000 Elsevier Science B.V
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