NdNiO3 is known to undergo a metal-insulator transition at 200 K. Thin film
s of NdNiO3 are synthesized on LaAlO3 single crystal and Si by RF sputterin
g magnetron, and subsequent annealing under oxygen pressure. The metal-insu
lator transition investigated by a temperature study of the resistivity app
ears at 150 or 200 K depending on the deposition process. The films have be
en studied by Raman scattering from 60 K to room temperature, and strong ev
olution of the spectra are observed. These investigations show significant
changes of frequencies and intensities at several temperatures that suggest
structural changes in the vicinity of the metal-insulator transitions. (C)
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