Fj. Currell et al., Application to argon ions of a new technique to measure the two-electron contribution to the ground state energy of helium-like ions, J PHYS B, 33(4), 2000, pp. 727-734
Citations number
23
Categorie Soggetti
Physics
Journal title
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS
We have measured the two-electron contribution of the ground state energy o
f helium-like argon ions using an electron beam ion trap (EBIT). A two-dime
nsional map was measured showing the intensity of x-rays from the trap pass
ing through a krypton-filled absorption cell. The independent axes of this
map were electron beam energy and x-ray energy. From this map, we deduced t
he two-electron contribution of the ground state of helium-like argon. This
experimentally determined Value (312.4 +/- 9.5 eV) was found to be in good
agreement with our calculated values (about 303.35 eV) and previous calcul
ations of the same quantity. Based on these measurements, we have shown tha
t a ten-day absorption spectroscopy run with a super-EBIT should be suffici
ent to provide a new benchmark value for the two-electron contribution to t
he ground state of helium-like krypton. Such a measurement would then const
itute a test of quantum electrodynamics to second order.