The effect of oxygen annealing on the dielectric aging of manganese-doped P
b(Fe2/3W1/3)O-3 (PFW) ceramics is investigated in an attempt to clarify the
role of defects on aging. Evident relaxer-type aging is observed in as-sin
tered manganese-doped PFW samples. The degree of aging gradually decreases
as the annealing time increases, and no aging kr observed for 100 h of anne
aling, which supports the correlation between oxygen vacancies and aging.