Crack tip morphology of slowly growing cracks in glass

Authors
Henaux, S Creuzet, F
Citation
S. Henaux et F. Creuzet, Crack tip morphology of slowly growing cracks in glass, J AM CERAM, 83(2), 2000, pp. 415-417
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
ISSN journal
00027820 → ACNP
Volume
83
Issue
2
Year of publication
2000
Pages
415 - 417
Database
ISI
SICI code
0002-7820(200002)83:2<415:CTMOSG>2.0.ZU;2-2
Abstract
We present atomic force microscopy (AFM) observations of crack tips in glas s during subcritical propagation. These have been obtained by means of an A FM sample holder which has been specially designed to propagate indentation cracks in glass plates. Crack tips in soda-lime-silica glass are always pr eceded by a few nanometers deep deformation. In vitreous silica, no other s urface deformation than the crack itself could be detected. For both materi als, the crack opening is found to largely exceed the elastic solution.