Crystallization and microstructure development of sol-gel derived titaniumdioxide thin films with single and multiple layers

Citation
Y. Ohya et al., Crystallization and microstructure development of sol-gel derived titaniumdioxide thin films with single and multiple layers, J AM CERAM, 82(10), 1999, pp. 2601-2606
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
ISSN journal
00027820 → ACNP
Volume
82
Issue
10
Year of publication
1999
Pages
2601 - 2606
Database
ISI
SICI code
0002-7820(199910)82:10<2601:CAMDOS>2.0.ZU;2-2
Abstract
Sol-gel TiO2 thin films were fabricated at 650 degrees C using sol that was derived from the Ti((OPr)-Pr-i)(4)-diethanolamine-H2O-(PrOH)-Pr-i system. Repeated deposition and rapid heating resulted in columnar grains, whereas slow heating-at a rate of 10 degrees-20 degrees C/min-caused equiaxed grain s to form. Slow heating caused the film to crystallize as anatase. The anat ase-to-rutile ratio of the rapidly heated film increased with increased dep osition thickness and repeated depositions. The tendency of the thicker fil m to crystallize as rutile during rapid heating was attributed to the rapid grain growth of fine anatase grains.