Citation
Xj. Tian et al., A characteristic analysis of high-speed integrated circuit chip based on laser probe, MICROEL REL, 40(2), 2000, pp. 329-332
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714
→ ACNP
Volume
40
Issue
2
Year of publication
2000
Pages
329 - 332
Database
ISI
SICI code
0026-2714(200002)40:2<329:ACAOHI>2.0.ZU;2-8
Abstract
In this paper, a compact electro-optic sampling system that includes a phas
e shifter and a frequency doubler has been described in detail. A double-fr
equency phase shift scanning has been introduced for the first time to our
knowledge. Some problems on the measurements, such as the optical beam feed
back and the sampling voltage scaling, have been discussed. (C) 2000 Elsevi
er Science Ltd. All rights reserved.