Origin of the magnetization reversal of an Fe thin film on Si(111)

Citation
Mc. Dos Santos et al., Origin of the magnetization reversal of an Fe thin film on Si(111), PHYS REV B, 61(2), 2000, pp. 1311-1314
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
10980121 → ACNP
Volume
61
Issue
2
Year of publication
2000
Pages
1311 - 1314
Database
ISI
SICI code
1098-0121(20000101)61:2<1311:OOTMRO>2.0.ZU;2-R
Abstract
The magnetic behavior of a 60-Angstrom Fe film grown on Si(111) is reported and discussed. Scanning tunneling microcopy images showed Fe stripes along one of the (110) directions in the (111) plane, which favors easy magnetiz ation axis parallel to the stripes. Inverted in-plane hysteresis loops and loops with unusual local peaks were measured and interpreted. A phenomenolo gical model was proposed to interpret the magnetization data and an excelle nt concordance between the experimental and the calculated curves was obtai ned. The peculiarities in the magnetization curves are directly related to the very small misorientation of the sample's surface from the (111) plane, and to competing anisotropies. The model calculations showed that the magn etization leaves the sample's plane for small fields, forming an obtuse ang le with the field for some configurations, thus resulting in negative reman ence, which was confirmed by the nonzero values of the normal to the plane magnetization component from the magneto-optic Kerr effect polarimetry meas urements.