The energy-dispersive X-ray-diffraction (EDXD) and Raman spectroscopy are u
sed to study phase transitions of Zn0.83Mn0.17Se thin film up to 17.5 and 1
6.1 GPa, respectively. The EDXD results show that possible zinc blende(B3)
to sodium chloride phase(B1) structure transition for Zn0.83Mn0.17Se thin f
ilm occurs at 10.0 GPa. The unloading run reveals a reversible phase transi
tion existed in the Zn0.83Mn0.17Se thin film. For micro-Raman spectra at am
bient pressure, three Raman peaks are distinct as LO, TO, and Mn local mode
s in Zn1-xMnxSe bulk. As the pressure is increased to 10.9 GPa, metallizati
on occurs, the LO and Mn local phonon peaks disappear while the two unident
ified Raman peaks of TO mode are still observable above the metallization p
ressure till 17.5 GPa. The phase transition pressure P-t obtained from the
results of micro-Raman spectra seems to be in good agreement with that obta
ined by EDXD measurements. (C) 2000 Published by Elsevier Science B.V. All
rights reserved.