Low angle grain boundary transport in YBa2Cu3O7-delta coated conductors

Citation
Dt. Verebelyi et al., Low angle grain boundary transport in YBa2Cu3O7-delta coated conductors, APPL PHYS L, 76(13), 2000, pp. 1755-1757
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
13
Year of publication
2000
Pages
1755 - 1757
Database
ISI
SICI code
0003-6951(20000327)76:13<1755:LAGBTI>2.0.ZU;2-N
Abstract
Second generation, high-temperature superconducting wires are based on buff ered, metallic tape substrates of near single crystal texture. Strong align ment of adjacent grains was found to be necessary from previous work that s uggested large angle, YBa2Cu3O7-delta [001]-tilt boundaries reduce J(c) exp onentially with increasing misorientation angle (theta). We pursue the low- theta regime by evaluating single grain boundaries (GB) and biaxially align ed polycrystalline films utilizing both the rolling-assisted biaxially text ured substrates and ion-beam assisted deposition coated conductor architect ures. Analysis concludes that an exponential dependence on J(c) is applicab le for theta greater than or similar to 4 degrees, where the spacing betwee n the periodic disordered regions along the GB become smaller than a cohere nce length. (C) 2000 American Institute of Physics. [S0003-6951(00)02713-3] .