Adatom condensation and quantum dot sizes in InGaAs/GaAs (001)

Citation
R. Leon et al., Adatom condensation and quantum dot sizes in InGaAs/GaAs (001), APPL PHYS L, 76(12), 2000, pp. 1558-1560
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
12
Year of publication
2000
Pages
1558 - 1560
Database
ISI
SICI code
0003-6951(20000320)76:12<1558:ACAQDS>2.0.ZU;2-Z
Abstract
The sizes and concentrations of capped and surface InGaAs/GaAs quantum dots (QDs) grown under the same conditions have been investigated. Comparisons obtained with transmission electron microscopy and scanning probe microscop y imaging show a significant enlargement in the sizes of surface QDs compar ed with capped QDs. This discrepancy in dot dimensions increases with decre asing island surface densities and can be partially explained by thermal ad atom condensation during sample cooling. These findings suggest a technique to estimate adatom concentrations and their migration lengths in strained heteroepitaxy. (C) 2000 American Institute of Physics. [S0003-6951(00)03312 -X].