Direct evidence for In-segregation in InGaN/GaN quantum-well structures is
given via highly spatially resolved energy dispersive x-ray analysis perfor
med in a dedicated scanning transmission electron microscope. The In fluctu
ations become increasingly pronounced in the vicinity of dislocations. The
latter assist In diffusion and cause severe Ga/In intermixing. (C) 2000 Ame
rican Institute of Physics. [S0003-6951(00)00911-6].