SURFACE-STRUCTURE DETERMINATION BY STM VS LEED

Scanning tunneling microscopy has been developed, among other applicat ions, into a powerful surface structural tool. Over time, it has becom e more apparent that theoretical modeling of the STM image is often ne cessary to reliably extract atomic positions. We here review recent ad vances in this direction and illustrate with several examples that geo metrical information is mixed not only with electronic structure infor mation and corresponding tip properties, but also with tunneling effec ts like interference between multiple tunneling channels.