Cs. Chang et Tt. Tsong, ANISOTROPIC STRAIN EFFECT ON MORPHOLOGY AND ATOMIC-STRUCTURE OF VICINAL SI(001) SURFACE, Progress in Surface Science, 54(3-4), 1997, pp. 387-405
On vicinal Si(001) surfaces, dependence of growth morphology on the ap
plied strain direction and formation of vacancy lines from Ag-induced
missing dimer vacancies are studied. Both phenomena are intimately rel
ated to the anisotropic nature of the strain field which originates fr
om the surface dimerization. Strain relief mechanism, reflecting on th
e surface morphology, is shown to be different in two orthogonal direc
tions. Normal to the steps, step-pair bunching and waving lead to form
ation of hillocks and pits. Along the step direction, bending of step
pairs forms a cusp which later develops into a deep groove. Toward the
atomic scale, the formation of the vacancy lines is driven by the sho
rt-range attractive interaction between the vacancies in adjacent dime
r rows and the long-range repulsive interaction between them in the sa
me dimer row. A full form and magnitudes of the interactions are deriv
ed from the thermally-excited wandering of the vacancy lines formed by
a nominal amount of Ag depositing onto the surface.