X-ray topographic investigation of quartz single crystals at high temperature, up to 1185 degrees C

Citation
U. Alter et J. Hartwig, X-ray topographic investigation of quartz single crystals at high temperature, up to 1185 degrees C, CRYST RES T, 35(2), 2000, pp. 207-212
Citations number
13
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CRYSTAL RESEARCH AND TECHNOLOGY
ISSN journal
02321300 → ACNP
Volume
35
Issue
2
Year of publication
2000
Pages
207 - 212
Database
ISI
SICI code
0232-1300(2000)35:2<207:XTIOQS>2.0.ZU;2-U
Abstract
Real time experiments were performed to study the structural behaviour of m onocrystalline quartz at high temperatures. White beam diffraction topograp hy in transmission geometry was used. A creation of Dauphine-twins took pla ce slightly below the alpha-beta-phase transition temperature. The diffract ion contrast of twins and temperature stresses disappeared above the alpha- beta-phase transition temperature. Up to 1185 degrees C neither changes of the defect structure nor a creation of new defects were observed. A. precur sor for a beginning of a reconstructive phase transition from quartz to cri stabolite could not be observed within a time interval of 2h at 1180 degree s C.