SCITT for board test of complex memories

Authors
Raaijmakers, R Christ, M
Citation
R. Raaijmakers et M. Christ, SCITT for board test of complex memories, ELECTRO ENG, 72(878), 2000, pp. 49
Citations number
2
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONIC ENGINEERING
ISSN journal
00134902 → ACNP
Volume
72
Issue
878
Year of publication
2000
Database
ISI
SICI code
0013-4902(200003)72:878<49:SFBTOC>2.0.ZU;2-O
Abstract
Boundary Scan has become widespread in recent years. However, Boundary Scan is less suitable for fast, modern memories, such as SDRAM, because the tes t method is relatively slow. Philips and Fujitsu have decided to co-operate in finding a solution to this test problem. The resulting method described here, called SCITT, only requires an additional 1% silicon and is offered as a good value addition to Boundary Scan.