A practical fit for the critical surface of NbTi

Authors
Citation
L. Bottura, A practical fit for the critical surface of NbTi, IEEE APPL S, 10(1), 2000, pp. 1054-1057
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
10
Issue
1
Year of publication
2000
Pages
1054 - 1057
Database
ISI
SICI code
1051-8223(200003)10:1<1054:APFFTC>2.0.ZU;2-X
Abstract
Known expressions for the critical temperature, critical field and Pinning force in NbTi are combined into a self consistent fit formula that provides the critical current density as a function of temperature and field. The m ain advantage of such a fit is the extended validity range. Data available in literature and measurements on LHC strands are used to demonstrate the a ccuracy of the fit. The J(c) data-sets used to cover a range of field from 0 T to 9 T and temperature from 1.9 K to 9 K. The standard deviation of the fits presented is of the order of 5 % or better. This accuracy is generall y sufficient for design purposes, extrapolation and scaling of measured res ults. Better accuracy, e.g. for short sample limit prediction, can be achie ved restricting the domain of validity.