New developments of computer-aided crystallographic analysis in transmission electron microscopy

A new computer program for on-line crystallographic analysis in transmissio n electron microscopy (TEM) is presented. The program is based on the fast online determination of single-crystal orientations from Kikuchi and spot p atterns. Spot patterns, which are particularly useful in the case of highly deformed metals, are analyzed by a new digital image processing procedure. This procedure improves the precision and ease of the orientation measurem ent. The program permits the on-line measurement of glide systems character ized by the Burgers vector and the crystallographic line direction of dislo cations and their glide planes. The determination of twin systems, based on the misorientation calculation for any crystal structure, is included as w ell. The possibility of determining the foil thickness permits the complete crystallographic characterization of interfaces. Finally the program facil itates the discrimination of phases and includes the fit of the lattice par ameters a, b and c from diffraction patterns. The new procedures are descri bed in detail. Application examples are given for all functions.