Correction of specimen absorption in X-ray diffuse scattering experiments with area-detector systems

Citation
S. Scheidegger et al., Correction of specimen absorption in X-ray diffuse scattering experiments with area-detector systems, J APPL CRYS, 33, 2000, pp. 35-48
Citations number
31
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
33
Year of publication
2000
Part
1
Pages
35 - 48
Database
ISI
SICI code
0021-8898(200002)33:<35:COSAIX>2.0.ZU;2-V
Abstract
Methods for correcting specimen absorption in X-ray diffraction experiments , dedicated to two-dimensional area-detector systems and broad diffuse scat tering phenomena, are implemented and tested. The respective transmission f actors, in relation to the crystal or specimen shape, are applied to the in tensity of every pixel of the two-dimensional detector. The pixel-wise appr oach allows for a fully quantitative treatment of continuous diffraction in formation, such as disorder diffuse scattering or scattering from amorphous materials, which is collected with a two-dimensional detector system. This is in contrast to routine data reduction, where the transmission factors a re applied to the integrated Bragg intensities only. Furthermore, it is pos sible to assign different linear attenuation coefficients to the paths of t he incident and scattered beams, as is desirable, for instance, in the case of X-ray holography with an internal resonant scatterer. Broad diffuse sca ttering data collected with synchrotron radiation and numerical calculation s are used to study in detail the influence of experimental parameters on t he accuracy of the pixel-wise absorption correction.