Scanning photoelectron microscopy study of the laser-induced transformations of polycrystalline CdTe films

Citation
Aj. Nelson et al., Scanning photoelectron microscopy study of the laser-induced transformations of polycrystalline CdTe films, J APPL PHYS, 87(7), 2000, pp. 3520-3525
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
7
Year of publication
2000
Pages
3520 - 3525
Database
ISI
SICI code
0021-8979(20000401)87:7<3520:SPMSOT>2.0.ZU;2-U
Abstract
We have used pulsed-laser treatment to provide highly localized chemical re actions in the near-surface region of polycrystalline CdTe thin films. Usin g scanning photoelectron microscopy, the lateral changes in the composition and morphology of the films as a function of the irradiation conditions an d of the distance from the center of the laser beam were characterized. Res ults show that the films undergo thermal-induced heterogeneity in the morph ology and in the lateral distribution of the elements and chemical phases d ue to local melting and dissociation of the film. This transformation leads to a local increase of the conductivity and enrichment with elemental Te. (C) 2000 American Institute of Physics. [S0021-8979(00)02107-1].