Critical point and vapor pressure measurements at high temperatures by means of a new apparatus with ultralow residence times

A new flow method has been employed to obtain critical point and vapor pres sure data at high temperatures for four compounds: squalane, toluene, ethyl benzene, and styrene. This new flow method allows the determination of reli able critical points and vapor pressures for thermally unstable or otherwis e reactive compounds. The critical point is inferred from other measurement s in the critical region. The measurement accuracy is less than that obtain ed by more conventional methods, but this method has been used where conven tional methods fail.